HELIOS FT-IR Microsampler
The HELIOS is a new generation infrared micro sampling accessory. It combines the high throughput and ease-of-use of an ATR accessory with the video image and sample positioning flexibility of a full infrared microscope. The downward looking ergonomic design and XYZ sample stage make sample positioning quick and easy. The patented ATR crystal design and beam condensing optics provide true micro-measurement resolution (250 microns).
The HELIOS is mounted on Bruker Optics' proprietary quick-lock baseplate for quick, easy, and reproducible mounting in the sample compartment. The utilization of reflection and transmission illumination provides optimal viewing of almost any sample, even during infrared data collection.
Small samples such as fibers, combinatorial micro beads, minute amounts of protein crystals and trace samples can all be easily analyzed with total confidence. Samples as small as 20 microns can be measured without the need for a liquid nitrogen cooled MCT detector.
The HELIOS is suitable for the analysis of samples from practically any industrial environment. The analysis of paper, pharmaceutical, integrated circuits, historic works of art, preservation, and many other products are performed quickly and easily.
ATR Analysis
Small or large samples can be readily analyzed with the HELIOS using ATR. Simply place the sample on the sample stage, position using the manual stage (while viewing the sample), make ATR contact with sample using the calibrated pressure indicator, and collect the spectrum. Diamond, Germanium, Silicon, and Zinc Sulfide crystal options are available. Diamond and Zinc Sulfide allow crystal-clear viewing of the sample, and Germanium and Silicon are typically used for materials possessing a high index of refraction. Diamond is recommended when analyzing hard or intractable samples. ATR is the recommended method of analysis, when good contact can be made between the sample and crystal. The analysis area is 250 microns.
External Reflection Sample Analysis
Many samples can be analyzed using external reflection techniques such as specular and diffuse reflection, as well as reflection absorption. The nature of the sample determines what the resulting data will look like and what type of post-processing, if any will be needed. For external reflection analysis, simply slide the crystal holder to the open position, focus your sample, and collect the spectrum. The infrared analysis area is 1 mm.
Specular Reflection
Highly reflective samples are most easily analyzed using external reflectance. This analysis is suitable for samples that are at least 1% reflective and are flat. The resulting absorption bands have derivative shapes and are corrected using the Kramers-Kronig transformation. Typical samples include shiny polymers, plastics, inks, etc.
Diffuse Reflection
Highly scattering samples, such as paper products, powders, etc. are easily analyzed by external reflectance. After collecting the infrared spectrum, correct the data using the Kubelka-Munk correction.
Reflection Absorption
The HELIOS™ can also be used to analyze thin coatings on highly reflective substrates by reflectance absorption. Films between 100nm and 20 microns can be analyzed using this technique. The infrared light passes through the sample once, reflects of the reflective surface, through the sample again, and is collected.
Options
- Silicon ATR crystal plate (A 531-B08)
- Diamond ATR crystal plate (A 531-B15)
- Germanium ATR crystal plate (A 531-B10)
- Zinc Sulfide ATR crystal plate (A 531-B12)
- Natural Fiber Lib